CVE-2018-11865

En bref

Sévérité
Non disponible
EPSS
EPSS 0.23 % · centile 14 (2026-10-28)
État
PUBLISHED
Publiée
Mise à jour
Attribuée par
qualcomm
Statut NVD
Modified

Description

Integer overflow may happen when calculating an internal structure size due to lack of validation of the input length in Snapdragon Mobile, Snapdragon Wear in version MDM9206, MDM9607, MDM9650, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDM710, Snapdragon_High_Med_2016.

Scores

VersionScoreVecteurÉvalué par
CVSS 3.0HIGH 7.8CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:HNVD · nvd@nist.gov (Primary)
CVSS 2.0HIGH 7.2AV:L/AC:L/Au:N/C:C/I:C/A:CNVD · nvd@nist.gov (Primary)

Faiblesses (CWE)

Références européennes

Avis du CERT-FR

Configurations affectées (CPE NVD)

Produits affectés

ProduitVersions
Qualcomm, Inc. · Snapdragon Mobile, Snapdragon Wearaffected MDM9206, MDM9607, MDM9650, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 835, SD 845, SD 850, SDA660, SDM429, SDM439, SDM630, SDM632, SDM636, SDM660, SDM710, Snapdragon_High_Med_2016

Références

Sources

SourceLicence
CVE List (CVEProject cvelistV5)CVE Program Terms of Use
EPSS (FIRST.org)FIRST — attribution requested
ENISA EUVDENISA — reproduction authorised, source acknowledged
CERT-FR (ANSSI)Licence Ouverte / Etalab 2.0
NVD (NIST) via fkie-cad/nvd-json-data-feedsPublic domain — this product uses data from the NVD API but is not endorsed or certified by the NVD