Qualcomm, Inc. Snapdragon Mobile, Snapdragon Wear

CVE-2018-5879
HIGH 8.8

En bref

Source
NVD
EPSS
EPSS 0.43 % · centile 37 ()
État
PUBLISHED
Publiée
Mise à jour
Attribuée par
qualcomm
Statut NVD
Modified

Description

Improper length check while processing an MQTT message can lead to heap overflow in snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 636, SD 835, SDA660, SDM630, SDM660

Faiblesses (CWE)

Références

Scores

VersionScoreVecteurÉvalué par
CVSS 3.0HIGH 8.8CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:HNVD · nvd@nist.gov (Primary)
CVSS 2.0HIGH 8.3AV:A/AC:L/Au:N/C:C/I:C/A:CNVD · nvd@nist.gov (Primary)

Références européennes

Configurations affectées (CPE NVD)

Produits affectés

ProduitVersions
Qualcomm, Inc. · Snapdragon Mobile, Snapdragon Wearaffected MDM9206, MDM9607, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 636, SD 835, SDA660, SDM630, SDM660

Sources

SourceLicence
CVE List (CVEProject cvelistV5)CVE Program Terms of Use
EPSS (FIRST.org)FIRST — attribution requested
ENISA EUVDENISA — reproduction authorised, source acknowledged
NVD (NIST) via fkie-cad/nvd-json-data-feedsPublic domain — this product uses data from the NVD API but is not endorsed or certified by the NVD