CVE-2018-5914

At a glance

Severity
Not available
EPSS
EPSS 0.21 % · percentile 11 (2026-10-28)
State
PUBLISHED
Published
Updated
Assigner
qualcomm
NVD status
Modified

Description

Improper input validation in TZ led to array out of bound in TZ function while accessing the peripheral details using the incoming data in Snapdragon Mobile, Snapdragon Wear version MDM9206, MDM9607, MDM9650, SD 210/SD 212/SD 205, SD 425, SD 430, SD 450, SD 625, SD 650/52, SD 835, SDA660.

Scores

VersionScoreVectorScored by
CVSS 3.0HIGH 7.8CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:HNVD · nvd@nist.gov (Primary)
CVSS 2.0HIGH 7.2AV:L/AC:L/Au:N/C:C/I:C/A:CNVD · nvd@nist.gov (Primary)

Weaknesses (CWE)

European references

CERT-FR advisories

Affected configurations (NVD CPE)

Affected products

ProductVersions
Qualcomm, Inc. · Snapdragon Mobile, Snapdragon Wearaffected MDM9206, MDM9607, MDM9650, SD 210/SD 212/SD 205, SD 425, SD 430, SD 450, SD 625, SD 650/52, SD 835, SDA660

References

Sources

SourceLicence
CVE List (CVEProject cvelistV5)CVE Program Terms of Use
EPSS (FIRST.org)FIRST — attribution requested
ENISA EUVDENISA — reproduction authorised, source acknowledged
CERT-FR (ANSSI)Licence Ouverte / Etalab 2.0
NVD (NIST) via fkie-cad/nvd-json-data-feedsPublic domain — this product uses data from the NVD API but is not endorsed or certified by the NVD